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Event tomorrow – sign up now! Join ZEISS and Aalen University microscopy experts tomorrow for an online discussion

Microscopy Across Systems - Correlative Workflows for Materials Analysis, Tuesday 2nd of May at 4pm CEST

Martin Kuttge, Tim Schubert, and Dominic Hohs from Carl Zeiss Microscopy and Aalen University will present tomorrow on the best way to correlate different kinds of microscopy for research and materials analysis.

They will discuss the most effective way to combine light and scanning electron microscopy, and explore ways to combine these two complementary techniques that will improve your research and analysis work.In more detail, they will cover:

  • Correlative microscopic workflows in material science and engineering
  • A selection of use cases investigated with high-performance light, digital, and scanning electron microscopes (SEM) including energy dispersive spectrometry (EDS)
  • Application examples covering the design of new hard magnetic materials and fracture analysis & surface quality inspection of functional materials

By attending the event, you will learn to:

  • Use correlative microscopy and learn how it helps you to perform multi-modal microscopy
  • Understand the process–structure–properties relationship and allow for quality inspection in an R&D environment.

Increase sample throughput with correlative microscopy

More information: here



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